IJEEEE 2013 Vol.3(6): 477-482 ISSN: 2010-3654
DOI: 10.7763/IJEEEE.2013.V3.282
DOI: 10.7763/IJEEEE.2013.V3.282
Ontology-Based Sentiment Analysis Model of Customer Reviews for Electronic Products
K. M. Sam and C. R. Chatwin
Abstract— This paper reports on a generalizable system model design that analyzes the unstructured customer reviews inside the posts about electronic products on social networking websites. For the purposes of this study, posts on social networking websites have been mined and the keywords are extracted from such posts. The extracted keywords and the ontologies of electronic products and emotions form the base for the sentiment analysis model which is used to understand online consumer behavior in the market. In order to enhance system accuracy, negating and enhancing terms are considered in the proposed model. Sentiment analysis is demonstrated to be extremely important to system accuracy.
Index Terms— Semantic content retrieval, sentiment analysis, non-rule based unstructured data, query analysis, HowNet, ontology.
K. M. Sam is with the University of Macau, Macao (e-mail: tonysam@umac.mo). C. R. Chatwin is with University of Sussex, United Kingdom (e-mail: c.r.chatwin@sussex.ac.uk).
Index Terms— Semantic content retrieval, sentiment analysis, non-rule based unstructured data, query analysis, HowNet, ontology.
K. M. Sam is with the University of Macau, Macao (e-mail: tonysam@umac.mo). C. R. Chatwin is with University of Sussex, United Kingdom (e-mail: c.r.chatwin@sussex.ac.uk).
Cite: K. M. Sam and C. R. Chatwin, " Ontology-Based Sentiment Analysis Model of Customer Reviews for Electronic Products," International Journal of e-Education, e-Business, e-Management and e-Learning vol. 3, no. 6, pp. 477-482, 2013.
General Information
ISSN: 2010-3654 (Online)
Abbreviated Title: Int. J. e-Educ. e-Bus. e-Manag. e-Learn.
Frequency: Quarterly
DOI: 10.17706/IJEEEE
Editor-in-Chief: Prof. Kuan-Chou Chen
Executive Editor: Ms. Nancy Lau
Abstracting/ Indexing: EBSCO, Google Scholar, Electronic Journals Library, QUALIS, ProQuest, INSPEC (IET)
E-mail: ijeeee@iap.org
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